Method Detects Defects in Magnetic Nanodevices
A team of researchers from the NIST Center for Nanoscale Science and Technology, the Royal Institute of Technology and the Univ. of Maryland have demonstrated a microscopy method to identify magnetic defects in an array of magnetic nanostructures. Their work was published in Applied Physics Letters. The method represents an important step towards identifying, measuring and correcting the magnetic properties of defective devices in future information storage technologies.
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